Products
1. Dual beam metering system, combined with advanced circuit measurement and control systems, makes the instrument highly stable and extremely low noise.2. The newly designed excellent optical system and high-performance holographic flash grating ensure the low stray light of the instrument, allowing the instrument to operate stably at the full wavelength in four decimal places after the absorbance value (2 decimal places after the transmittance value).3. Fully automatic control system and advanced design concept to ensure high reliability and stability of the instrument.
86-175-5409-3886
cedric@cedriccn.com
Specification:
Model | C-UV1900 |
Wavelength range | 190-1100nm |
Spectral bandwidth | 2nm |
Wavelength accuracy | ±0.1nm (at 656.1nm), ±0.3nm in the whole area |
Wavelength repeatability | ≤0.1nm |
Photometric accuracy | ±0.002A (0-0.5A), ±0.004A (0.5-1A), ±0.2%T (0-100%) |
Photometric repeatability | ±0.001A (0-0.5A), ±0.002A (0.5-1A), ≤0.15%T (0-100%) |
Stray light | ≤0.02%T |
Stability | ±0.0004A (at 500nm) |
Baseline straightness | ±0.0004A |
Working method | T, A, C, E |
Photometric range | 0-200%T,-4-4A |
Data output | USB interface |
Printout | Parallel port |
Display system | 320×240-bit highlighting, large-screen LCD |
Net Weight | 25kg |
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