Products
1. Dual beam metering system, combined with advanced circuit measurement and control systems, makes the instrument highly stable and extremely low noise.2. The newly designed excellent optical system and high-performance holographic flash grating ensure the low stray light of the instrument, allowing the instrument to operate stably at the full wavelength in four decimal places after the absorbance value (2 decimal places after the transmittance value).3. The sample chamber design with a detachable structure makes it easy to replace different accessories to meet different analysis needs.4. Chinese and English operating software developed in the Windo
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cedric@cedriccn.com
Specification:
Model | C- UV1901 |
Wavelength range | 190-1100nm |
Spectral bandwidth | 1nm |
Wavelength accuracy | ±0.1nm (at 656.1nm), ±0.3nm in the whole area |
Wavelength repeatability | ≤0.1nm |
Photometric accuracy | ±0.002A (0-0.5A), ±0.004A (0.5-1A), ±0.2%T (0-100%) |
Photometric repeatability | ±0.001A (0-0.5A), ±0.002A (0.5-1A), ≤0.15%T (0-100%) |
Stray light | ≤0.02%T |
Stability | ±0.0004A (at 500nm) |
Baseline straightness | ±0.0004A |
Working method | T, A, C, E |
Photometric range | 0-200%T,-4-4A |
Data output | USB interface |
Printout | Parallel port |
Display system | 320×240-bit highlighting, large-screen LCD |
Net Weight | 24kg |
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